, van der Giessen, Alina G.;Toepker, Michael, H.;Donelly, Patrick, M.;Bamberg,, Fabian;Schlett, Christopher, L.;Raffle,, Christopher;Irlbeck,, Thomas;Lee,, Hang;, van Walsum, Theo;Maurovich-Horvat,, Pal;Gijsen, Frank J., H.;Wentzel, Jolanda, J.;Hoffmann,, Udo
doi: 10.1097/RLI.0b013e3181e0a541pmid: 20479650