%0 Journal Article
%T A MFL Mechanism-Based Self-Supervised Method for Defect Detection With Limited Labeled Samples
%A Zhao, He
%A Liu, Jinhai
%A Tang, Jianhua
%A Shen, Xiangkai
%A Lu, Senxiang
%A Wang, Qiannan
%A ,
%J IEEE Transactions on Instrumentation and Measurement
%V 72
%P 1-10
%@ 0018-9456
%D 2023-01-01
%I Institute of Electrical and Electronics Engineers (IEEE)
%~ DeepDyve