%0 Journal Article
%T Interface Mutation: an approach for integration testing
%A Delamaro, M.E.
%A Maidonado, J.C.
%A Mathur, A.P.
%A ,
%J IEEE Transactions on Software Engineering
%V 27
%N 3
%P 228-247
%@ 0098-5589
%D 2001-03-01
%I Institute of Electrical and Electronics Engineers (IEEE)
%~ DeepDyve