%0 Journal Article
%T Retention and endurance analysis for 2T0C DRAM based on ALD-ITZO thin film transistors
%A Wei, Jingxuan
%A Zhang, Yu
%A Li, Nannan
%A Chen, Bojia
%A Bai, Rongxu
%A Wu, Xuefeng
%A Zhang, Wenrui
%A Ji, Li
%A Sun, Qingqing
%A Zhang, David Wei
%A Hu, Shen
%J Nanotechnology
%V 36
%N 27
%P 12
%@ 0957-4484
%D 2025-07-07
%I IOP Publishing
%~ DeepDyve