%0 Journal Article
%T 2D analysis of functional stress degradations on power VDMOS transistor
%A Beydoun, B.
%A Zoaeter, M.
%A Alaeddine, A.
%A Rachidi, I.
%A Bahsoun, F.
%A Charlot, JJ.
%A Charles, JP.
%J Microelectronics International
%V 21
%N 2
%P 16-22
%@ 1356-5362
%D 2004-08-01
%I Emerald Group Publishing Limited
%~ DeepDyve