%0 Journal Article
%T Applicant and examiner citations in U.S. patents: An overview and analysis
%A Alcácer, Juan
%A Gittelman, Michelle
%A Sampat, Bhaven
%A ,
%J Research Policy
%@ 0048-7333
%D 2009-03-01
%I Elsevier BV
%~ DeepDyve