TY - JOUR
AU1 - Prudnikov, I.
AB - Secondary-emission meters are simple in structural practicability: they have small dimensions and are reliable. They permit measurements to be made of the current strengths of constant and pulsed beams over a wide range of current densities with an accuracy of ±0.5%, and they permit observation of the pulse shape of a beam with a duration of up to 10−9 sec.
TI - Secondary emission meters for the current strength of a beam of accelerated electrons
JF - Measurement Techniques
DO - 10.1007/BF00814948
DA - 2004-11-29
UR - https://www.deepdyve.com/lp/springer-journals/secondary-emission-meters-for-the-current-strength-of-a-beam-of-Gbjtm40Atq
SP - 1452
EP - 1454
VL - 17
IS - 9
DP - DeepDyve
ER -