TY - JOUR
AU - Méring, J.
AB - Previous studies of the line profiles of the basal reflections of microcrystalline muscovites were refined by an adaptation of the method developed by Maire and Méring. In order to evaluate the variation of interlayer spacings, the method required only relative values of Fourier coefficients, without the correction for instrumental broadening, which was the source of one of the most critical problems previously. Instead of Kα radiation, Kβ radiation was used to record line profiles since difficulties associated with the separation of Kα
1 and Kα
2 radiations could not be overcome satisfactorily.
TI - An Analysis of X-Ray Diffraction Line Profiles of Microcrystalline Muscovites
JF - Clays and Clay Minerals
DO - 10.1346/CCMN.1971.0190609
DA - 1971-12-01
UR - https://www.deepdyve.com/lp/cambridge-university-press/an-analysis-of-x-ray-diffraction-line-profiles-of-microcrystalline-Q2D2Guy0gU
SP - 405
EP - 413
VL - 19
IS - 6
DP - DeepDyve
ER -