TY - JOUR
AU - BARMIN, Yu. V.
AB -  The usual algorithm of the structure factor calculation, which is widely used for amorphous metals and amorphous semiconductors, cannot be applied to a number of amorphous metal oxides. Instead, we have developed a new algorithm based on the middle line method. It uses analytical properties of the structure factor and radial distribution function. The method has been applied to amorphous PbTiO 3 . 
TI - Processing of X-Ray Diffraction Data in Structure Investigations of Amorphous Metal Oxides
JF - Ferroelectrics
DO - 10.1080/00150190490493087
DA - 2004-01-01
UR - https://www.deepdyve.com/lp/taylor-francis/processing-of-x-ray-diffraction-data-in-structure-investigations-of-szCdqPUosf
SP - 191
EP - 197
VL - 307
IS - 1
DP - DeepDyve
ER -