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The dynamics of shallow donor ionization in n-GaAs studied with subnanosecond FIR-induced photoconductivity

The dynamics of shallow donor ionization in n-GaAs studied with subnanosecond FIR-induced... The low-temperature dynamics of far-infrared (FIR) excited electrons bound to shallow donors has been studied in n-GaAs. In a magnetic field of 3.6 T the electrons are excited from the ground state to the 2p+1 donor state with a short pulse of 118.8 mu m radiation and the photoconductive response is monitored with subnanosecond resolution. The observed response can be described with a simple three-level rate equation model, yielding a minimum value of 5*109 s-1 for the ionization rate of a shallow donor in the 2p+1 bound state. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Semiconductor Science and Technology IOP Publishing

The dynamics of shallow donor ionization in n-GaAs studied with subnanosecond FIR-induced photoconductivity

Semiconductor Science and Technology , Volume 9 (1) – Jan 1, 1994

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Copyright
Copyright © IOP Publishing Ltd
ISSN
0268-1242
eISSN
1361-6641
DOI
10.1088/0268-1242/9/1/006
Publisher site
See Article on Publisher Site

Abstract

The low-temperature dynamics of far-infrared (FIR) excited electrons bound to shallow donors has been studied in n-GaAs. In a magnetic field of 3.6 T the electrons are excited from the ground state to the 2p+1 donor state with a short pulse of 118.8 mu m radiation and the photoconductive response is monitored with subnanosecond resolution. The observed response can be described with a simple three-level rate equation model, yielding a minimum value of 5*109 s-1 for the ionization rate of a shallow donor in the 2p+1 bound state.

Journal

Semiconductor Science and TechnologyIOP Publishing

Published: Jan 1, 1994

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