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Features of the transport phenomena and temperature dependence of the Gamma 6- Gamma 8 energy gap in undoped zero-gap n-(Cd,Hg)Te crystals

Features of the transport phenomena and temperature dependence of the Gamma 6- Gamma 8 energy gap... A self-consistent calculation procedure of the temperature dependences of the Gamma 6- Gamma 8 energy gap (Eg) and charge carrier mobility is proposed for undoped Hg1-xCdxTe real crystals (x approximately 0.1). It is shown that, in combination with methods of direct determination of Eg, this method may be used later for investigation of the electron density of states in the Gamma 8 band degeneration region of zero-gap semiconductors. The mobility was calculated assuming a fourfold degenerate acceptor level in the conduction band with energy determined taking into account the features of the dielectric function under conditions of dynamic screening. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Semiconductor Science and Technology IOP Publishing

Features of the transport phenomena and temperature dependence of the Gamma 6- Gamma 8 energy gap in undoped zero-gap n-(Cd,Hg)Te crystals

Semiconductor Science and Technology , Volume 9 (1) – Jan 1, 1994

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References (4)

Copyright
Copyright © IOP Publishing Ltd
ISSN
0268-1242
eISSN
1361-6641
DOI
10.1088/0268-1242/9/1/004
Publisher site
See Article on Publisher Site

Abstract

A self-consistent calculation procedure of the temperature dependences of the Gamma 6- Gamma 8 energy gap (Eg) and charge carrier mobility is proposed for undoped Hg1-xCdxTe real crystals (x approximately 0.1). It is shown that, in combination with methods of direct determination of Eg, this method may be used later for investigation of the electron density of states in the Gamma 8 band degeneration region of zero-gap semiconductors. The mobility was calculated assuming a fourfold degenerate acceptor level in the conduction band with energy determined taking into account the features of the dielectric function under conditions of dynamic screening.

Journal

Semiconductor Science and TechnologyIOP Publishing

Published: Jan 1, 1994

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