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- Publisher
- Cambridge University Press
- Copyright
- 1993 The Psychometric Society
- ISSN
- 0033-3123
- eISSN
- 1860-0980
- DOI
- 10.1007/bf02294572
- Publisher site
- See Article on Publisher Site
Abstract
Abstract A model-based modification (SIBTEST) of the standardization index based upon a multidimensional IRT bias modeling approach is presented that detects and estimates DIF or item bias simultaneously for several items. A distinction between DIF and bias is proposed. SIBTEST detects bias/DIF without the usual Type 1 error inflation due to group target ability differences. In simulations, SIBTEST performs comparably to Mantel-Haenszel for the one item case. SIBTEST investigates bias/DIF for several items at the test score level (multiple item DIF called differential test functioning: DTF), thereby allowing the study of test bias/DIF, in particular bias/DIF amplification or cancellation and the cognitive bases for bias/DIF.
Journal
Psychometrika – Cambridge University Press
Published: Jun 1, 1993
Keywords: Psychometrics; Assessment, Testing and Evaluation; Statistics for Social Sciences, Humanities, Law; Statistical Theory and Methods