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- Publisher
- Wiley
- Copyright
- Copyright © 1991 Wiley Subscription Services, Inc., A Wiley Company
- ISSN
- 1059-910X
- eISSN
- 1097-0029
- DOI
- 10.1002/jemt.1060190407
- pmid
- 1797990
- Publisher site
- See Article on Publisher Site
Abstract
The general techniques necessary to produce a high‐quality cross‐sectioned ceramic specimen for transmission electron microscope observation are outlined. A particularly important point is that the width of the glued region between faces of the ceramic specimen must be < 0.2 μm to prevent loss of the near‐surface region during ion milling. A recently developed vise for gluing ceramic cross‐section specimens is described, and some examples of the effect of glue thickness on specimen quality are shown.
Journal
Microscopy Research and Technique – Wiley
Published: Dec 1, 1991
Keywords: ; ; ; ;